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for depth profiling samples whose composition varies with depth
$7240 (US)


Sample spectra are measured layer-by-layer with the MTEC MicroLap device, which removes material in several micron thick increments.

MicroLap_device_from_Powerpoint Lapping_sequence_from_Powerpoint
Microlap_spectra_from_Powerpoint peak_height_vs_depth_from_Powerpoint