MicroLap
for depth profiling samples whose composition varies
with depth
$7240 (US)
Sample spectra are measured layer-by-layer with the MTEC MicroLap device, which removes material in several micron thick increments. |
|
 |
 |
 |
 |
+ Home
+ About Us
+ Products
+ Price List
+ Order Form
+ Technology
+ Demonstration
+ Applications Library
+ Instrument Manuals
+ PAS Literature
+ What's New
+ PAS Consultants
+ ICPPP Conference